A modular inspection and analysis system for electronic components attachable to user machine or can be use independently. For wider application, Polarizing observation is available. Superb image quality and erect images provide easy and quick detection of faults on the observed specimen.
|Optical System||Color Corrected Infinity Optical System [CCIS®]|
|Eyepieces||N-WF 10x/20mm, with diopter adjustment|
|Observation Tube||Widefield binocular 30° [F.N. 20]
Widefield trinocular 30° [F.N. 20] – light distribution 100:0/20:80
Widefield trinocular 30° [F.N. 20] – light distribution 50:50 fixed, Erect image
|Plan Objectives||5x, 0.13 N.A., 11.5mm W.D.
10x, 0.30 N.A., 6.8mm W.D.
20x, 0.40 N.A., 11.1mm W.D.
50x, 0.55 N.A., 8.2mm W.D.
|Focus||Coaxial movement; 30mm stroke; Fine focus with 2μm minimum increment|
|Stage||180 x 140 mm surface; 100 x 80 mm movement; coaxial controls (optional)|
|Stand||Dimension: 300 x 300mm|
|Incident light||12v 50w Halogen illuminator with external power supply; Halogen bulb exchangeable with 3W LED (4500K, 6000K)|
|Specimen Thickness||Max. 120mm|
|Warranty||Five (5) Year Limited Warranty.|